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[IEEE 2009 20th International Zurich Symposium on Electromagnetic Compatibility - Zurich, Switzerland (2009.01.12-2009.01.16)] 2009 20th International Zurich Symposium on Electromagnetic Compatibility - Modelling of Electromagnetic Immunity of Integrated Circuits by Artificial Neural Networks

✍ Scribed by Ceperic, Vladimir; Baric, Adrijan

Book ID: 126669886
Publisher: IEEE
Year: 2009
Weight: 700 KB
Category: Article
ISBN: 3952328642
DOI: 10.1109/EMCZUR.2009.4783468

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