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[IEEE 2009 17th IEEE International Requirements Engineering Conference (RE) - Atlanta, Georgia, USA (2009.08.31-2009.09.4)] 2009 17th IEEE International Requirements Engineering Conference - Looking for Product Line Feature Models Defects: Towards a Systematic Classification of Verification Criteria

✍ Scribed by Salinesi, Camille; Rolland, Colette; Diaz, Daniel; Mazo, Raúl

Book ID: 125443054
Publisher: IEEE
Year: 2009
Weight: 184 KB
Category: Article
ISBN: 0769537618
DOI: 10.1109/re.2009.57

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