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[IEEE 2009 10th International Workshop on Microprocessor Test and Verification (MTV) - Austin, TX, USA (2009.12.7-2009.12.9)] 2009 10th International Workshop on Microprocessor Test and Verification - A Path-Oriented Timing-Aware Diagnosis Methodology of At-Speed Transition Tests

✍ Scribed by Zeng, Jing; Wang, Jing; Mateja, Michael

Book ID: 126755677
Publisher: IEEE
Year: 2009
Weight: 334 KB
Category: Article
ISBN: 142446479X
DOI: 10.1109/MTV.2009.21

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