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[IEEE 2009 10th International Symposium on Quality of Electronic Design (ISQED) - San Jose, CA, USA (2009.03.16-2009.03.18)] 2009 10th International Symposium on Quality of Electronic Design - A new low power test pattern generator using a variable-length ring counter

✍ Scribed by Zhou, Bin; Ye, Yi-zheng; Li, Zhao-lin; Wu, Xin-chun; Ke, Rui

Book ID: 120187979
Publisher: IEEE
Year: 2009
Weight: 886 KB
Category: Article
ISBN: 1424429528
DOI: 10.1109/ISQED.2009.4810302

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