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[IEEE 2009 10th International Symposium on Quality of Electronic Design (ISQED) - San Jose, CA, USA (2009.03.16-2009.03.18)] 2009 10th International Symposium on Quality of Electronic Design - New subthreshold concepts in 65nm CMOS technology

✍ Scribed by Moradi, Farshad; Wisland, Dag T.; Mahmoodi, Hamid; Peiravi, Ali; Aunet, Snorre; Cao, Tuan Vu

Book ID: 115492876
Publisher: IEEE
Year: 2009
Tongue: English
Weight: 896 KB
Volume: 0
Category: Article
ISBN: 1424429528
DOI: 10.1109/isqed.2009.4810287

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