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[IEEE 2008 Third International Conference on Availability, Reliability and Security - (2008.03.4-2008.03.7)] 2008 Third International Conference on Availability, Reliability and Security - Using Security Patterns to Combine Security Metrics

✍ Scribed by Heyman, Thomas; Scandariato, Riccardo; Huygens, Christophe; Joosen, Wouter

Book ID: 118142541
Publisher: IEEE
Year: 2008
Weight: 412 KB
Volume: 0
Category: Article
ISBN: 0769531024
DOI: 10.1109/ares.2008.54

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