[IEEE 2008 Second IEEE International Conference on Secure System Integration and Reliability Improvement (SSIRI) - Yokohama, Japan (2008.07.14-2008.07.17)] 2008 Second International Conference on Secure System Integration and Reliability Improvement - Two Methods for Estimating Product Lifetimes from only Warranty Claims Data

✍ Scribed by Suzuki, Kazuyuki; Alam, Mesbahul; Yoshikawa, Takuji; Yamamoto, Wataru

• Book ID: 115545433
• Publisher: IEEE
• Year: 2008
• Weight: 722 KB
• Volume: 0
• Category: Article
• DOI: 10.1109/ssiri.2008.59