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[IEEE 2008 International Symposium on Electromagnetic Compatibility - EMC Europe - Hamburg, Germany (2008.09.8-2008.09.12)] 2008 International Symposium on Electromagnetic Compatibility - EMC Europe - Multiple Linear Regression to detect shielding effectiveness degradations

✍ Scribed by Audone, Bruno; Giunta, Gergio

Book ID: 126752142
Publisher: IEEE
Year: 2008
Weight: 272 KB
Category: Article
DOI: 10.1109/EMCEUROPE.2008.4786802

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