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[IEEE 2008 International Symposium on Computer Science and Computational Technology - Shanghai, China (2008.12.20-2008.12.22)] 2008 International Symposium on Computer Science and Computational Technology - The W-Model for Testing Software Product Lines

โœ Scribed by Jin-hua, Li; Qiong, Li; Jing, Li


Book ID
121323776
Publisher
IEEE
Year
2008
Weight
586 KB
Category
Article
ISBN
1424437466

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