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[IEEE 2008 International Conference on Wavelet Analysis and Pattern Recognition (ICWAPR) - Hong Kong, China (2008.08.30-2008.08.31)] 2008 International Conference on Wavelet Analysis and Pattern Recognition - Auto-detection of dew point using wavelet transformation

✍ Scribed by Ying Sun, ; Zhao-Xue Chen, ; Ying Ye,

Book ID: 126680312
Publisher: IEEE
Year: 2008
Weight: 248 KB
Category: Article
ISBN: 1424422388
DOI: 10.1109/ICWAPR.2008.4635838

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