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[IEEE 2008 International Conference on Software Testing, Verification, and Validation - Lillehammer, Norway (2008.04.9-2008.04.11)] 2008 International Conference on Software Testing, Verification, and Validation - Test Instrumentation and Pattern Matching for Automatic Failure Identification

✍ Scribed by Travison, Dan; Staneff, Geoff


Book ID
127141642
Publisher
IEEE
Year
2008
Tongue
English
Weight
628 KB
Category
Article
ISBN
076953127X

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