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[IEEE 2008 International Conference on Signals and Electronic Systems - Krakow, Poland (2008.09.14-2008.09.17)] 2008 International Conference on Signals and Electronic Systems - ADC on-chip dynamic test by PWM technique

✍ Scribed by Ahmad, Shakeel; Dabrowski, Jerzy

Book ID: 126716414
Publisher: IEEE
Year: 2008
Tongue: Polish
Weight: 169 KB
Category: Article
ISBN: 8388309471
DOI: 10.1109/ICSES.2008.4673345

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