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[IEEE 2008 International Conference on Security Technology (SECTECH) - Sanya, China (2008.12.13-2008.12.15)] 2008 International Conference on Security Technology - Using Trust and Risk in Access Control for Grid Environment

✍ Scribed by Li, Yan; Sun, Huiping; Chen, Zhong; Ren, Jinqiang; Luo, Haining


Book ID
125436662
Publisher
IEEE
Year
2008
Weight
234 KB
Category
Article
ISBN
0769534864

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