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[IEEE 2008 International Conference on Nanoscience and Nanotechnology (ICONN) - Melbourne, Victoria (2008.02.25-2008.02.29)] 2008 International Conference on Nanoscience and Nanotechnology - Metrology for nanotechnology

✍ Scribed by Jamting, A.; Miles, J.

Book ID: 120881475
Publisher: IEEE
Year: 2008
Weight: 511 KB
Category: Article
ISBN: 1424415039
DOI: 10.1109/ICONN.2008.4639244

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