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[IEEE 2008 International Conference on Microwave and Millimeter Wave Technology (ICMMT) - Nanjing, China (2008.04.21-2008.04.24)] 2008 International Conference on Microwave and Millimeter Wave Technology - Statistical characteristic of scattering from randomly rough surfaces

✍ Scribed by Zhang Geng, ; Wu Zhensen, ; Zhang Hanlu,

Book ID: 125542359
Publisher: IEEE
Year: 2008
Weight: 764 KB
Category: Article
ISBN: 1424418798
DOI: 10.1109/ICMMT.2008.4540576

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