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[IEEE 2008 International Conference on Microelectronics - ICM - Sharjah, United Arab Emirates (2008.12.14-2008.12.17)] 2008 International Conference on Microelectronics - CAD models of the input admittance of RC wires: Comparison and selection strategies

✍ Scribed by Alioto, Massimo

Book ID: 126746546
Publisher: IEEE
Year: 2008
Weight: 418 KB
Category: Article
ISBN: 1424423694
DOI: 10.1109/ICM.2008.5393515

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