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[IEEE 2008 International Conference on High Voltage Engineering and Application (ICHVE) - Chongqing, China (2008.11.9-2008.11.12)] 2008 International Conference on High Voltage Engineering and Application - Effects of Series Reactor on Short-circuit Current and Transient Recovery Voltage

✍ Scribed by Zhen-xin, Geng; Xin, Lin; Jian-yuan, Xu; Chi, Tian

Book ID: 120627177
Publisher: IEEE
Year: 2008
Weight: 407 KB
Category: Article
ISBN: 1424438233
DOI: 10.1109/ICHVE.2008.4773988

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