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[IEEE 2008 International Conference on Computer Science and Software Engineering - Wuhan, China (2008.12.12-2008.12.14)] 2008 International Conference on Computer Science and Software Engineering - Some Metrics for Accessing Quality of Product Line Architecture

✍ Scribed by Zhang, Tao; Deng, Lei; Wu, Jian; Zhou, Qiaoming; Ma, Chunyan

Book ID: 120620315
Publisher: IEEE
Year: 2008
Weight: 322 KB
Category: Article
ISBN: 0769533361
DOI: 10.1109/CSSE.2008.500

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