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[IEEE 2008 International Conference on Computer Science and Software Engineering - Wuhan, China (2008.12.12-2008.12.14)] 2008 International Conference on Computer Science and Software Engineering - A Full-Reference Image Quality Assessment Algorithm Based on Haar Wavelet Transform

✍ Scribed by Ji, Guo-Li; Ni, Xiao-Ming; Bae, Hae-Young

Book ID: 120029445
Publisher: IEEE
Year: 2008
Weight: 533 KB
Category: Article
ISBN: 0769533361
DOI: 10.1109/CSSE.2008.858

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