[IEEE 2008 IEEE Radio Frequency Integrated Circuits Symposium (RFIC) - Atlanta, GA, USA (2008.06.17-2008.04.17)] 2008 IEEE Radio Frequency Integrated Circuits Symposium - The process variability of a V-band LC-VCO in 65nm SOI CMOS

[IEEE 2008 IEEE Radio Frequency Integrat

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[IEEE 2008 IEEE Radio Frequency Integrat

✍ Hyung Ki Ahn, ; Kun-Seok Lee, ; Hwayeal Yu, ; Hyoung-Seok Oh, ; Dongjin Keum, ; 📂 Article 📅 2008 🏛 IEEE ⚖ 313 KB

[IEEE 2008 IEEE Radio Frequency Integrat

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[IEEE 2008 IEEE Radio Frequency Integrat

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[IEEE 2008 IEEE Radio Frequency Integrat

✍ Cavallaro, Marco; Ragonese, Egidio; Palmisano, Giuseppe 📂 Article 📅 2008 🏛 IEEE ⚖ 632 KB

[IEEE 2008 IEEE Radio Frequency Integrat

✍ Shahin Mehdizad Taleie, ; Yongping Han, ; Copani, Tino; Bakkaloglu, Bertan; Kiae 📂 Article 📅 2008 🏛 IEEE ⚖ 415 KB