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[IEEE 2008 IEEE Radiation Effects Data Workshop - Tucson, AZ (2008.07.14-2008.07.18)] 2008 IEEE Radiation Effects Data Workshop - Investigation of the Mechanism of Stuck Bits in High Capacity SDRAMs

✍ Scribed by Scheick, Leif; Guertin, Steven; Nguyen, Duc

No coin nor oath required. For personal study only.

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