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[IEEE 2008 IEEE Petroleum and Chemical Industry Technical Conference (PCIC 2008) - Cincinnati, OH (2008.09.22-2008.09.24)] 2008 55th IEEE Petroleum and Chemical Industry Technical Conference - CT saturation calculations - are they applicable in the modern world? - Part III, low-ratio, high-current CT/microprocessor relay comparisons at a high-current testing laboratory

✍ Scribed by Cosse, Roy E.; Dunn, Donald G.; Spiewak, Robert M.; Bowen, James E.


Book ID
121325789
Publisher
IEEE
Year
2008
Weight
498 KB
Category
Article
ISBN
1424425204

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