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[IEEE 2008 IEEE MTT-S International Microwave Symposium Digest - MTT 2008 - Atlanta, GA, USA (2008.06.15-2008.06.20)] 2008 IEEE MTT-S International Microwave Symposium Digest - Novel approach for static nonlinear behavior identification in RF power amplifiers exhibiting memory effects

✍ Scribed by Hammi, Oualid; Carichner, Scott; Vassilakis, Bill; Ghannouchi, Fadhel M.

Book ID: 111689319
Publisher: IEEE
Year: 2008
Weight: 505 KB
Volume: 0
Category: Article
ISBN: 1424417805
DOI: 10.1109/mwsym.2008.4633070

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