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[IEEE 2008 IEEE International Symposium on Software Reliability Engineering (ISSRE) - Seattle, WA, USA (2008.11.10-2008.11.14)] 2008 19th International Symposium on Software Reliability Engineering (ISSRE) - E-RACE, A Hardware-Assisted Approach to Lockset-Based Data Race Detection for Embedded Products

✍ Scribed by Huang, Lily; Smith, Michael; Tran, Albert; Miller, James

Book ID: 120238442
Publisher: IEEE
Year: 2008
Weight: 193 KB
Category: Article
DOI: 10.1109/ISSRE.2008.23

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