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[IEEE 2008 IEEE International Symposium on Knowledge Acquisition and Modeling Workshop (KAM 2008 Workshop) - Wuhan, China (2008.12.21-2008.12.22)] 2008 IEEE International Symposium on Knowledge Acquisition and Modeling Workshop - Research on Tilt Sensor Technology

✍ Scribed by Han, Qiushi; Chen, Chen

Book ID: 120847696
Publisher: IEEE
Year: 2008
Tongue: English
Weight: 115 KB
Category: Article
ISBN: 1424435307
DOI: 10.1109/KAMW.2008.4810608

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