𝔖 Bobbio Scriptorium

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[IEEE 2008 IEEE International Symposium on Electrical Insulation - Vancouver, BC (2008.06.9-2008.06.12)] Conference Record of the 2008 IEEE International Symposium on Electrical Insulation - Evaluation Methods of Contamination Flashover Voltage Performance of Semi-conducting Glaze Insulators

✍ Scribed by Hayashi, A.; Yamada, K.; Saka, C.; Sakanishi, K.; Matsuoka, R.

Book ID: 126642294
Publisher: IEEE
Year: 2008
Weight: 142 KB
Category: Article
ISBN: 1424420911
DOI: 10.1109/ELINSL.2008.4570372

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