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[IEEE 2008 IEEE International Conference on Vehicular Electronics and Safety (ICVES 2008) - Columbus, OH (2008.09.22-2008.09.24)] 2008 IEEE International Conference on Vehicular Electronics and Safety - Simulation and testing environments for the DARPA Urban Challenge

✍ Scribed by Ozguner, Umit; Redmill, Keith; Biddlestone, Scott; Ming Feng Hsieh, ; Yazici, Ahmet; Toth, Charles

Book ID: 120626494
Publisher: IEEE
Year: 2008
Weight: 1017 KB
Category: Article
ISBN: 1424423597
DOI: 10.1109/ICVES.2008.4640881

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