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[IEEE 2008 IEEE International Conference on RFID (IEEE RFID 2008) - Las Vegas, NV, USA (2008.04.16-2008.04.17)] 2008 IEEE International Conference on RFID - A Tamper Detection Method for RFID Tag Data

✍ Scribed by Yamamoto, Akira; Suzuki, Shigeya; Hada, Hisakazu; Mitsugi, Jin; Teraoka, Fumio; Nakamura, Osamu

Book ID: 115523554
Publisher: IEEE
Year: 2008
Weight: 324 KB
Volume: 0
Category: Article
ISBN: 1424417120
DOI: 10.1109/rfid.2008.4519365

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