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[IEEE 2008 IEEE International Conference on Industrial Technology - (ICIT) - Chengdu, China (2008.04.21-2008.04.24)] 2008 IEEE International Conference on Industrial Technology - A method for improving the reliability of the gateway system by using OSEK and duplication scheme

✍ Scribed by Kim, J.H.; Seo, S.H.; Moon, T.Y.; Kwon, K.H.; Jeon, J.W.; Hwang, S. H.

Book ID: 126695102
Publisher: IEEE
Year: 2008
Weight: 291 KB
Category: Article
ISBN: 1424417058
DOI: 10.1109/ICIT.2008.4608403

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