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[IEEE 2008 IEEE International Conference on Industrial Technology - (ICIT) - Chengdu, China (2008.04.21-2008.04.24)] 2008 IEEE International Conference on Industrial Technology - Classification of faults in double circuit lines using Wavelet transforms

✍ Scribed by Martin, F.; Aguado, J.A.; Medina, M.; Munoz, J.

Book ID: 120071242
Publisher: IEEE
Year: 2008
Weight: 132 KB
Category: Article
ISBN: 1424417058
DOI: 10.1109/ICIT.2008.4608397

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