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[IEEE 2008 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM) - Singapore, Singapore (2008.12.8-2008.12.11)] 2008 IEEE International Conference on Industrial Engineering and Engineering Management - Regression-based limits for multivariate poisson control chart

✍ Scribed by Kuo, T.I; Chiu, J.E.

Book ID: 126535289
Publisher: IEEE
Year: 2008
Tongue: English
Weight: 607 KB
Category: Article
ISBN: 1424426294
DOI: 10.1109/IEEM.2008.4738232

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