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[IEEE 2008 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM) - Singapore, Singapore (2008.12.8-2008.12.11)] 2008 IEEE International Conference on Industrial Engineering and Engineering Management - The effect of non-normality on performance of linear profile monitoring

✍ Scribed by Noorossana, R.; Vaghefi, A.; Dorri, M.

Book ID: 120926398
Publisher: IEEE
Year: 2008
Tongue: English
Weight: 529 KB
Category: Article
ISBN: 1424426294
DOI: 10.1109/IEEM.2008.4737871

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