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[IEEE 2008 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Hong Kong, China (2008.12.8-2008.12.10)] 2008 IEEE International Conference on Electron Devices and Solid-State Circuits - Cross-sectional shape effects on the electronic properties of Silicon nanowires

✍ Scribed by Sajjad, Redwan Noor; Bhowmick, Sishir; Khosru, Quazi D. M.

Book ID: 121862884
Publisher: IEEE
Year: 2008
Weight: 900 KB
Category: Article
ISBN: 1424425395
DOI: 10.1109/EDSSC.2008.4760704

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