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[IEEE 2008 IEEE International Conference on Computational Intelligence for Measurement Systems and Applications (CIMSA) - Istanbul, Turkey (2008.07.14-2008.07.16)] 2008 IEEE International Conference on Computational Intelligence for Measurement Systems and Applications - Reliability assessment under uncertainty using Dempster-Shafer and vague set theories

✍ Scribed by Pashazadeh, Saeid; Sharifi, Mohsen

Book ID: 118246430
Publisher: IEEE
Year: 2008
Weight: 852 KB
Volume: 0
Category: Article
ISBN: 1424423058
DOI: 10.1109/cimsa.2008.4595847

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