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[IEEE 2008 IEEE Industry Applications Society Annual Meeting (IAS) - Edmonton, Alberta, Canada (2008.10.5-2008.10.9)] 2008 IEEE Industry Applications Society Annual Meeting - New Epstein Frame for Core Loss Measurements at High Frequencies and High Flux Densities

✍ Scribed by Manyage, Marubini J.; Pillay, Pragasen

Book ID: 115534862
Publisher: IEEE
Year: 2008
Weight: 345 KB
Volume: 0
Category: Article
ISBN: 1424422787
DOI: 10.1109/08ias.2008.51

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