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[IEEE 2008 IEEE Custom Integrated Circuits Conference - CICC 2008 - San Jose, CA, USA (2008.09.21-2008.09.24)] 2008 IEEE Custom Integrated Circuits Conference - Measurement and analysis of variability in 45nm strained-Si CMOS technology

✍ Scribed by Pang, Liang-Teck; Nikolic, Borivoje

No coin nor oath required. For personal study only.

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