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[IEEE 2008 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) - Anchorage, AK, USA (2008.06.23-2008.06.28)] 2008 IEEE Conference on Computer Vision and Pattern Recognition - Fast image search for learned metrics

✍ Scribed by Jain, Prateek; Kulis, Brian; Grauman, Kristen

Book ID: 121081260
Publisher: IEEE
Year: 2008
Weight: 405 KB
Category: Article
ISBN: 1424422426
DOI: 10.1109/CVPR.2008.4587841

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