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[IEEE 2008 IEEE Compound Semiconductor Integrated Circuits Symposium (CSICS) - Monterey, CA, USA (2008.10.12-2008.10.15)] 2008 IEEE Compound Semiconductor Integrated Circuits Symposium - Improved Drain-Source Current Model for HEMT's with Accurate Gm Fitting in All Regions

✍ Scribed by Liu, Lin Sheng (author);Jian-Guo, Ma (author)

Book ID: 120267534
Publisher: IEEE
Year: 2008
Weight: 320 KB
Category: Article
ISBN: 1424419409
DOI: 10.1109/CSICS.2008.27

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