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[IEEE 2008 IEEE Compound Semiconductor Integrated Circuits Symposium (CSICS) - Monterey, CA, USA (2008.10.12-2008.10.15)] 2008 IEEE Compound Semiconductor Integrated Circuits Symposium - Reliability of Metal-Insulator-Metal (MIM) after Electrostatic Discharge (ESD) Stress

✍ Scribed by Sasaki, Hajime; Sugimoto, Hiroshi; Tanino, Noriyuki

Book ID: 118159692
Publisher: IEEE
Year: 2008
Weight: 225 KB
Volume: 0
Category: Article
ISBN: 1424419395
DOI: 10.1109/csics.2008.17

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