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[IEEE 2008 IEEE 25th Convention of Electrical and Electronics Engineers in Israel (IEEEI) - Eilat, Israel (2008.12.3-2008.12.5)] 2008 IEEE 25th Convention of Electrical and Electronics Engineers in Israel - ATC Assessment with transient stability constraints

✍ Scribed by Sarussi, David; Rabinovici, Raul

Book ID: 118168487
Publisher: IEEE
Year: 2008
Weight: 654 KB
Volume: 0
Category: Article
ISBN: 142442481X
DOI: 10.1109/eeei.2008.4736574

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