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[IEEE 2008 Eighth IEEE International Working Conference on Source Code Analysis and Manipulation (SCAM 2008) - Beijing (2008.09.28-2008.09.29)] 2008 Eighth IEEE International Working Conference on Source Code Analysis and Manipulation - Constructing Subtle Faults Using Higher Order Mutation Testing

✍ Scribed by Jia, Yue; Harman, Mark

Book ID: 121656057
Publisher: IEEE
Year: 2008
Tongue: English
Weight: 334 KB
Category: Article
ISBN: 0769533531
DOI: 10.1109/SCAM.2008.36

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