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[IEEE 2008 Design, Automation and Test in Europe - Munich, Germany (2008.03.10-2008.03.14)] 2008 Design, Automation and Test in Europe - Design Guidelines for Metallic-Carbon-Nanotube-Tolerant Digital Logic Circuits

✍ Scribed by Zhang, Jie; Patil, Nishant P.; Mitra, Subhasish

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