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[IEEE 2008 Design, Automation and Test in Europe - Munich, Germany (2008.03.10-2008.03.14)] 2008 Design, Automation and Test in Europe - CASP: Concurrent Autonomous Chip Self-Test Using Stored Test Patterns

✍ Scribed by Li, Yanjing; Makar, Samy; Mitra, Subhasish

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