[IEEE 2008 Conference on Precision Electromagnetic Measurements (CPEM 2008) - Broomfield, CO, USA (2008.06.8-2008.06.13)] 2008 Conference on Precision Electromagnetic Measurements Digest - Direct comparisons of ac resistance standards of various technology designs

✍ Scribed by Bounouh, A.; Satrapinski, A.; Ziade, F.; Morilhat, A.; Leprat, D.

• Book ID: 115461955
• Publisher: IEEE
• Year: 2008
• Weight: 166 KB
• Volume: 0
• Category: Article
• ISBN: 1424423996
• DOI: 10.1109/cpem.2008.4574897