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[IEEE 2008 Asia and South Pacific Design Automation Conference (ASPDAC) - Seoul, South Korea (2008.03.21-2008.03.24)] 2008 Asia and South Pacific Design Automation Conference - Technology modeling and characterization beyond the 45nm node

✍ Scribed by Nassif, Sani R.

Book ID: 118007485
Publisher: IEEE
Year: 2008
Weight: 94 KB
Volume: 0
Category: Article
ISBN: 1424419220
DOI: 10.1109/aspdac.2008.4483944

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