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[IEEE 2008 Annual Reliability and Maintainability Symposium - Las Vegas, NV, USA (2008.01.28-2008.01.31)] 2008 Annual Reliability and Maintainability Symposium - Functional and dysfunctional analysis of a mechatronic system

✍ Scribed by Demri, Amel; Charki, Abderafi; Guerin, Fabrice; Christofol, Herve

Book ID: 120276093
Publisher: IEEE
Year: 2008
Weight: 529 KB
Category: Article
ISBN: 142441461X
DOI: 10.1109/RAMS.2008.4925780

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