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[IEEE 2008 9th International Scientific-Technical Conference on Actual Problems of Electronic Instrument Engineering (APEIE) - Novosibirsk, Russia (2008.09.23-2008.09.25)] 2008 9th International Conference on Actual Problems of Electronic Instrument Engineering - Simulation study of some goodness-or-fit tests properties

✍ Scribed by Lemeshko, B.Y.; Rogozhnikov, A.P.

Book ID: 115468816
Publisher: IEEE
Year: 2008
Weight: 193 KB
Volume: 0
Category: Article
ISBN: 1424428254
DOI: 10.1109/apeie.2008.4897176

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