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[IEEE 2008 7th World Congress on Intelligent Control and Automation - Chongqing, China (2008.06.25-2008.06.27)] 2008 7th World Congress on Intelligent Control and Automation - A kernel-based bayesian classifier for fault detection and classification

✍ Scribed by ChunMei Yu, ; Quan Pan, ; YongMei Cheng, ; HongCai Zhang,

Book ID: 120278918
Publisher: IEEE
Year: 2008
Weight: 134 KB
Category: Article
ISBN: 1424421136
DOI: 10.1109/WCICA.2008.4592910

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