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[IEEE 2008 7th International Caribbean Conference on Devices, Circuits and Systems (ICCDCS) - Cancun, Mexico (2008.04.28-2008.04.30)] 2008 7th International Caribbean Conference on Devices, Circuits and Systems - Design and modeling of an RFIC pad structure and probe contact impedance correction for on-wafer measurements

✍ Scribed by Capovilla, C. E.; Tavora A. S., A.; Kretly, L. C.

Book ID: 121825930
Publisher: IEEE
Year: 2008
Weight: 672 KB
Category: Article
ISBN: 1424419565
DOI: 10.1109/ICCDCS.2008.4542646

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