𝔖 Bobbio Scriptorium

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[IEEE 2008 51st IEEE International Midwest Symposium on Circuits and Systems (MWSCAS) - Knoxville, TN, USA (2008.08.10-2008.08.13)] 2008 51st Midwest Symposium on Circuits and Systems - Trapped charge characterization and removal on floating-gate transistors

✍ Scribed by Degnan, B. P.; Hasler, P.; Twigg, Christopher M.

Book ID: 121202796
Publisher: IEEE
Year: 2008
Weight: 460 KB
Category: Article
ISBN: 1424421667
DOI: 10.1109/MWSCAS.2008.4616875

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